作者:Neudeck, Philip G;Spry, David J;Krasowski, Michael J;等
发布日期:2018
关键词:AMBIENT TEMPERATURE;SILICON CARBIDES;...
发布机构:
作者:Neudeck, Philip G;Spry, David J;Krasowski, Michael J;等
发布日期:2018
关键词:CHIPS (MEMORY DEVICES);DESIGN ANALYSIS;...
发布机构:
作者:Neudeck, Philip G;Spry, David J;Krasowski, Michael J;等
发布日期:2018
关键词:INTEGRATED CIRCUITS;JFET;...
发布机构:
作者:Fink, Patrick W InventorLin, Gregory Y InventorKennedy, Timothy F InventorNgo, Phong H Inventor
发布日期:2018
关键词:RADIO FREQUENCIES;INTEGRATED CIRCUITS;...
发布机构:
5 Room Temperature Radiation Testing of a 500 °C Durable 4H-SiC JFET Integrated Circuit Technology [科技报告]
作者:Lauenstein, Jean-Marie;Neudeck, Philip G;Ryder, Kaitlyn L;等
发布日期:2019
关键词:INTEGRATED CIRCUITS;HIGH TEMPERATURE ENVIRONMENTS;...
发布机构:
作者:Spry, David J InventorNeudeck, Philip G Inventor
发布日期:2018
关键词:SEMICONDUCTOR DEVICES;INTEGRATED CIRCUITS;...
发布机构: